Spectrophotometer; InGaAs Detector, INGaAs detector, 190-1600 nm, V-780ST, Jasco, 150 VA

• V-780 Specifications:

• Spectral Bandwidth (SBM): UV-Visible: 0.1, 0.2, 0.5, 1, 2, 5, 10 nm; L2, L5, L10 nm (low stray light mode); M1, M2 nm (micro cell mode)

• Spectral Bandwidth (SBM): NIR: 0.2, 0.4, 0.5, 1, 2, 4, 10, 20; L4, L10, L20 nm (low stray light mode); M2, M4 nm (micro cell mode)

• Light Source: Halogen lamp, Deuterium lamp (Light source exchange wavelength: Between 330 and 350 nm)

• Baseline Stability: ±0.0003 Abs/hour

• Optical System: Czerny-Turner grating mount, Single Monochromator. Fully symmetrical double-beam

• Light Source: Halogen lamp, Deuterium lamp

• Detector: PMT, Peltier cooled PbS

• Wavelength Accuracy: +/-0.3 nm (at 656.1 nm), +/-1.0 nm (at 1312.2 nm)

• Wavelength Repeatability: +/-0.05 nm (UV-Vis), +/-0.1 nm (NIR)

• Scanning Speed: 10~4000 nm/min (8000 nm/min in preview mode)

• Slew Speed: UV-Vis: 12,000 nm/min, NIR: 48,000 nm/min

• Stray Light: 1 % (198 nm KCL 12 g/L aqueous solution), 0.005 % (220 nm NaI 10 g/L aqueous solution, 0.005 % (340 nm NaNO2 50 g/L aqueous solution), 0.005 % (370 nm NaNO2 50 g/L aqueous solution), SBW: L2nm, 0.04 % (1420 nm: H2O), SBW: L4 nm

• Photometric Range: UV-Visible: -4~4 Abs; NIR: -3~3 Abs

• Photometric Accuracy: +/-0.0015 Abs (0 to 0.5 Abs); +/-0.0025 Abs (0.5 to 1 Abs); +/-0.3 %T Tested with NIST SRM 930D

• Photometric Repeatability: +/-0.0005 Abs (0 to 0.5 Abs), +/-0.0005 Abs (0.5 to 1 Abs), Tested with NIST SRM 930D

• RMS Noise: 0.00003 Abs; (0 Abs, wavelength: 500 nm, measurement time: 60 sec, SBW :2 nm)

• Baseline Flatness: +/-0.0002 Abs (200 - 1600 nm)

• Baseline Stability: 0.0003 Abs/hour, 0.04 % (220 nm NaI 10 g/L aqueous solution), 0.02 % (340 nm NaNO2 50 g/L aqueous solution), 0.02 % (370 nm NaNO2 50 g/L aqueous solution), (10 mm cell); ±0.0004 Abs/hour, (Wavelength: 250 nm, response: slow and SBW: 2nm.)

• Detector: Photomultiplier tube, Peltier cooled InGaAs photodiode

• Standard Programs: Abs/%T meter, Quantitative analysis, Spectrum measurement, Time course measurement, Fixed wavelength measurement, Validation, Daily Check, Two wavelength time course measurement

• Features on all models: reduced noise and stray light with sophisticated electronic and optical design, delivers fast scanning without wavelength tracking errors, dark correction with stray light reduction, reliable peak assignment, user-friendly operation, analog output, IQ start button provides comprehensive validation to USP, EP and JP

• Accessories (inquire for pricing and additional information): Automatic Peltier Multi-Cell Holders, Peltier Thermostatted Single Cell Holders, Constant Temperature Cell Holders/Cell Changers, Liquid and Film Cell Holders/Cell Changers, Temperature Control Accessories, Micro-Volume Liquid Transmission Cell Holders, Optical Fiber Units, Integrating Spheres, Absolute Reflectance, Specular Reflectance, Autosampler, Sippers, Flow Cells, Spectra Manager Software Suite, iRM-1000 Intelligent Remote Module, Standard Measurement Programs, Optional Programs,